May 26, 2010 Weekly High Risk Electronic Components
Posted by Jenny Miller on Wed, May 26, 2010 @ 04:01 PM
As of May 26, 2010, be on the lookout for the following high risk devices:
· Kemet T520V226M020ATE040, 100% failure - high ESR
· Texas Instruments OPA2541SM, 16% failure - clipped and clamped output
· ON Semiconductor NID6002NT4G, 100 failure - high drain-to-source leakage current
· Fairchild FDB2532, 5% failure - low gate threshhold voltage, Vgs(th), and high drain-to-source leakdage current (Idss)
· Nichicon PCF0J331MCL1GS, 100% failure - high ESR
· Analog Devices AD8310ARM, 100% failure - output is clamping to the supply and drawing current at no load to overheat the devices
· Texas Instruments TPS40009DGQR, 96% failure - unstable output and feedback voltages
· BS62LV4006-EIP55, 10% failure - bad protective diodes
· Texas Instruments OPA2343UA, 16% failure - no signal on both channels
