As of September 1, 2010, be lookout for the following high risk electronic components:
- Vishay Si3865BDV-T1-E3, 100% failure - high on-state drain-source resistance, Rds(on), and shorts.
- Texas Instruments TPS72501DCQR, 56% failure - low output voltage.
- Texas Instruments TPS79501DCQR, 50% failure - fluctuating output voltage.
- STMicroelectronics STP5NK80Z-10N, 6% failure - Rds(on) within range busmixed gate threshold voltage, Vgs(th), results higher and lower than manufacturer specifications.
- Texas Instruments MAX3232IPW, 32% failure - low triangular signals at the driver output.
- Vishay U440, 9% failure - low breakdown voltage between gate and source, V(br)gss, low gate source voltage in off state, Vgs(off), that the drain current still high when Vgs was above -6V.
- Fairchild FDD8424H, 6% failure - high drain-to-source leakage, Idss, and high Vgs(th).
- PMC/Agilient HDMP-1022G, 5% failure - open/short pins and bad protection diodes (overvoltage damage).
- PMC/Agilent HDMP-1024G, 6% failure - open/short pins and bad protection diodes (overvoltage damage).
- NXP BCW60D, 44% failure - opens, high base current and high collector to base leakage, Icbo.
- Toshiba TLP280-4GB, 8% failure, the diode was open resulting in open collector-emitter saturation voltage, Vce(sat).
- Infineon IPB100N06S3L-04, 100% failure - high gate threshold voltage, Vgs(th).
- Texas Instruments TL062ACD, 5% failure - low output swing and faulty output waves (see below photo).
- PMC-Sierra PM4354-NGI, 32% failure - open/short pins and bad protection diodes (overvoltage damage).
- Infineon ITS4880R, 15% failure - outputs remain low when input is high (failured output switching function).
As of August 23, 2010, be lookout for the following high risk electronic components:
- Infineon TLE6285G, 34% failure - low receiver outputs.
- Harris/Intersil CDP1805ACE, 80% failure - bad protection diodes.
- Harris/Intersil CDP1854ACE, 90% failure - bad protection diodes.
- Harris/Intersil CDP68HC68PIE, 23.2% failure - shorted pins and bad protection diodes (used).
- Murata/C&D NTV0509MC 59.3% failure - high input current, clamped negative output and output voltage above and below the tolderance envelope.
- Infineon BTS711L1, 7.5% failure - one of the four channels in a unit had no load current.
As of August 20, 2010, be on the lookout for the following high risk electronic components:
- Intel TE28F128J3C150, 5% failure - blank check (existing programming).
- Sony Blueray drive BC-5500S, 5% failure - intermittent SCSI error and stalls during Spin-up/Spin-down.
- Vishay Si7852DP-T1-GE3, 19.8% failure - open MOSFET, high Idss, low Vgs(th).
- Spansion S29AL016D90TFI020, 25% failure - write program and verify errors (cannot accept programming).
- Atmel AT91SAM7S256-AU, 5.4% failure - blank-check, program, and verify errors (previously programmed, cannot accept new programming).
- Xilinx XC3020A-7PQG100I, 25% failure - open/short pins and bad protection diodes.
As of August 5, 2010, be on the lookout for the following high risk electronic components:
- ON Semiconductor MC34063ADR2G, 8.5% failure - high output voltage, Vout, and short circuits.
- Intel N82C540-2, 14.9% failure - bad protection diodes (used).
- International Rectifier IRF7103QPBF, 9% failure - low gate threshold voltage, Vgs(th), and high drain-to-source leakage current, Idss.
- NXP PXAG49KBA, 17.5% failure - program ID error, write program failure, and program load error.
- Vishay 1.5KE20A-E3/54, 35.5% failure - high reverse current leakage, Id, and low breakdown voltages, Vbr.
- Vishay SI4488DY, 10% failure - high drain-to-source leakage current, Idss.
- Microchip TC913ACOA, 100% failure - low output voltage, Vout.
- Maxim MAX1792EUA33+T, 100% failure - low output voltage, Vout.
As of July 27th, 2010, be on the lookout for the following high risk electronic components:
-
Xilinx XC3020-70PC84I, 56% failure - bad protection diodes (used/overvoltage damage).
-
Vishay SI6865BDV-TI-E3, 30% failure - high on resistance, Rds(on).
-
International Rectifier IRF7855PBF, 100% failure - low gate threshold voltage, Vgs(th).
As of July 12, 2010, be on the lookout for the following high risk devices:
- TDK ACT45B-510-2P, 100% failure - low inductance.
- NEC/Tokin TEESVA1A60M8R, 10% failure - low capacitance and high ESR.
- ON Semiconductor NCV33152DR2G, 12.5% failure - inactive low-side transistor.
- Texas Instruments 35ZLH220MFZ8X11.5, 100% failure - high inductance.
As of July 6, 2010, be on the lookout for the following high risk devices:
- Intersil/Elantek EL4093CSZ, 38% failure - distorted outputs.
- Atmel ATMEGA169PV-8MU, 6.4% failure - program identification error.
- Analog Devices (PMI) MLT04GS, 8.4% failure - clamped outputs.
- Texas Instruments UCC2813DTR-0, 12.8% failure - ouput reference voltages for devices with alternate suffixes.
- Xilinx XC3020-70PC84I, 14% failure - short pins and bad protection diodes.
As of June 25, 2010, be on the lookout for the following high risk devices:
- Infineon BTS7960B, 51% failure - output not switching.
- Vishay U1SB-E3, 9.5% failure - hih Ir (reverse current) and Vf (instantaneous voltage).
- Altera EPM7160SQC160-7, 34.8% failure -cannot access JTAG ID Code.
- Altera EPM7032SLC44-7N, 100% failure - program ID error.
As of June 18, be on the lookout for the following high risk devices:
- Infineon transistor SPP11N60CFD, 66% failure - low Gate Threshold Voltage, Vgs(th).
- Analog Devices Supervisory/Sequencing Circuit ADM1060ARUZ, 6% failure - open/short pins and bad protection diodes.
- STMicroelectronics PowerMOSFET VNS3N04D, 17.5% failure - high drain-to-source leakage current, Idss, and high Static Drain-Source On Resistance, Rds(on).
As of June 14, 2010, be on the lookout for the following high risk devices:
- Texas Instruments TA3004PFBR, 9% failure - short pins and bad protection diodes.
- Nippon Electric Company (NEC) UPD71055C-10, 8% failure - bad protection diodes.
- Texas Instruments UC2854DW(G4), 10% failure - low reference voltage.
- Infineon SPP20N60C3, 5% failure - shorted drain-to-source junction.
- ST Mictroelectronics VNS3NV04D, 20% failure - high static drain-source On Resistance, Rds(on), and Drain-to-Source Leakage Current, Idss.
- Altera EPM7160SQC160-7, 34% failure - cannot access JTAG ID Code.
As of May 26, 2010, be on the lookout for the following high risk devices:
- Kemet T520V226M020ATE040, 100% failure - high ESR
- Texas Instruments OPA2541SM, 16% failure - clipped and clamped output
- ON Semiconductor NID6002NT4G, 100 failure - high drain-to-source leakage current
- Fairchild FDB2532, 5% failure - low gate threshhold voltage, Vgs(th), and high drain-to-source leakdage current (Idss)
- Nichicon PCF0J331MCL1GS, 100% failure - high ESR
- Analog Devices AD8310ARM, 100% failure - output is clamping to the supply and drawing current at no load to overheat the devices
- Texas Instruments TPS40009DGQR, 96% failure - unstable output and feedback voltages
- BS62LV4006-EIP55, 10% failure - bad protective diodes
- Texas Instruments OPA2343UA, 16% failure - no signal on both channels
As of May 19, 2010, be on the lookout for the following high risk devices:
- ST Microelectronics ST62T28CM6, 100% failure - blank check (parts previously programmed)
- Micron MT47H64M16HR-3AT:3, 10.3% failure - open/short pins, bad protection diodes, missing solder balls
- Sanyo 6TPF330M9L, 100 failure - high ESR
- Texas Instruments TPS40054PWPR, 100% failure - low output voltage caused by low reference voltage at the FB pin.