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This Week's Highest Counterfeiting Risks | Electronic Components

As of July 26, 2011 be lookout for the following high risk electronic components:
 
  • Texas Instruments ISO1050DUBR (Lot Code ZHD7) - 58% failure - non-switching bus and receiver outputs. 
  • PMC Sierra/Agilent HDMP-1022 (Date Codes 0022, 0728, 0821, and 0822) - 27% failure - open pins and bad protection diodes. 
  • PMC Sierra/Agilent HDMP-1024 (Date Codes 0016 & 0821) - 16% failure - open pins and bad protection diodes. 
  • Infineon ITS716G (Date Code 1052) - 100% failure - high output voltage drop and devices remain active at Vbb < 4.5V even after coming from off-state. 
  • Cypress CY7C269-50WMB (Date Code 0012) - 19% failure - blank-check error (previously programmed). 
  • Lattice Semiconductor ISPLSI2064A80LTN100I (Date Code 0812) - 25% failure - blank-check error (previously programmed). 
  • Epson S1D13700F01A100 (Date Code 0820) - 8% failure - open pins and bad protection diodes. 
  • Texas Instruments BQ4017MC-70 (Date Code 1121) - 54% failure - program & verify error. 
  • Infineon BTS721L1 (Date Code 1023) - 23% failure - one or all outputs having low state at Vbb=5V. 
  • Toshiba 2SJ74-BL (Date Code 0912) - 100% failure - high Igss, low Idss, and high Vgs(off). 
  • Infineon BTS716G (Date Codes 0934 & 0946) - 18% failure - uncharacteristic voltage drops and false output states. 
  • Fujitsu 7MBR25NE-120 (Date Codes 0020 & 0603) - 100% failure - high Ices, high Imm, and high Vce(sat). 
  • Cypress CY7C276 (Date Codes 0018 & 0025) - 36% failure - blank-check error (previously programmed).
  • Texas Instruments BQ4017MC-70 (Date Code 1121) - 84% failure - program and verify error. 
 
As of July 7, 2011 be lookout for the following high risk electronic components:
 
  • Dallas DS17487-5 (Date Code 1109) - 5% failure - program and verify error.
  • PME Sierra/Agilent/HP HDMP-1022G (multiple Date Codes including 0821 & 0908) - 15% failure - open and short pins, bad protection diodes.
  • PMC Sierra/Agilent/HP HDMP-1024G (multiple Date Codes including 0911, 0913, 0923, 0931, 0953 & 9850) - 18% failure - open and short pins, bad protection diodes.
  • Mitsubishi CM50DY-24H (Lot Numbers E72SK2 & 692AA37) - 45% failure - low collector-emitter voltage, Vces.
  • IXYS DSEI2X101-06A (Date Code 0603) - 100% failure - high forward voltage, Vf.
  • Infineon ITS4141N (Date Code 1035) - 52% failure - still active at supply voltage of 7V and very low output voltage at supply voltage of 45V.
  • STMicroelectronics STD45NF758T4 (Date Code 0943) - 100% failure - low breakdown voltage, BVdss, and high on-state drain resistance, Rds(on)
As of June 1, 2011 be lookout for the following high risk electronic components:
  • Agilent HDMP-1022 (Date Code 0606) - 6% failure - open/short pins and bad protection diodes. 
  • Toshiba TMPN3150B1AFG (Date Codes 0926) -6% failure - open/short pins and bad protection diodes.
  • Intel PR21555BBSL7UG (Date Codes 0743 & 0833) - 6% failure - open/short pins, bad protection diodes, and missing BGA balls.
  • Texas Instruments TMS320F2811PBKQ (Date Code not marked or labeled) - 76% failure -locked flash and short pins.
  • Littlefuse SLD24U-017 (Date Code not marked or labeled) - 9% failure - high reverse current, Ir.
  • Semikron SKM200GAL123D (Date Code 0810) - 67% failure - high Ices drop from 1,200V to 1,000V.
  • Vishay SFH6186-4 (Date Code 1027) - 83% failure - low current transfer ratio, CTR.
  • Linear Technology LT1790ACS6-2.5 (Date Code 1024) - 15% failure - low output current (10%) and high output current (5%).
  • Philips BSS87 (Date Code not marked or labeled) - 12% failure - high Rds(on) and opens.
As of May 16, 2011 be lookout for the following high risk electronic components:
  • PMC Sierra/Agilent HDMP-1022G/HDMP-1022 (Date Codes 0029 & 0109) - 13% failure - open pins and bad protection diodes.
  • PMC Sierra/Agilent HDMP-1024G (Date Codes 0105 & 0719) - 17% failure - open pins and bad protective diodes.
  • Intersil DG509AAK (Date Code 0235) - 14% failure - on-resistance higher than 1KOhms and wrong switching state.
  • Epson/Crystal SPG8640BN (Date Code 0438) - 82% failure - 67% with output frequency of 153.6KHz ("CN" suffix), 9.5% with output frequency of 120KHz ("AN" suffix), and 5.5% with no output signal.
  • Toshiba TMPN3120FE5MG(I) (Date Code 0909) - 62% failure - open pins and bad protection diodes.
As of April 26, 2011 be lookout for the following high risk electronic components:
  • Atmel AT91FR40162SB-CU (Date Code 0914) - 46% failure - ID error and blank-check error (cannot be erased).
  • Renesas HD64F2168VTE33V (Date Code 0634) - 31% failure - poor pin contact (contaminated and bent pins).
  • Ramtron FM25L256-G (Date Codes 0534 & 0552) - 11% failure- program and verify error.
  • Atmel AT16V8BQL-15JU (Date Code 0810) - 29% failure - program and verify error.
  • International Rectifier HFA30PB120 (Date Code 0542) - 75% failure - high reverse current (>20uA at 1.2KV) and lowbreakdown voltage.
  • AVX TAJE108M004RNJ Tantalum Capacitor (Date Code 1048) - 10% failure - high dissipation factor.
  • Dallas DS2432 (Date Code 1004) - 6% failure - read program error.
  • Vishay 60EPU06PBF (Date Code 1015) - 88% failure - high forward voltage (above 1.68V with 60A forward current, If).
  • Microsemi UES1303 (Date Code not marked or labeled) - 100% failure - high forward voltage (above 1V with 6A forward current, If).
  • IXYS IXFN32N100P (Date Code 0627) - 100% failure - low gate-source threshold voltage, Vgs(th), and high gate-source saturation current.
As of April 18, 2011 be lookout for the following high risk electronic components:
  • NEC UPD78F9116BMC-5A4-A (Date Codes 0925 & 0927) - 13% failure - poor pin condition and failures for poor pin connection.
  • Samsung K9WAG08U1A-PIB0 (Date Code 0918) - 38% failure - program and verify error (all units are within 1 to 31 invalid blocks).
  • AVX TAJA335K016 Tantalum Capacitor (Date Code 1032) - 32% failure- high equivalent series resistance, ESR, and high dissipation factor, DF ortan.
  • Analog Devices AD743JN (Date Code 0231) - 100% failure - low output voltage.
  • Vishay SSB43L-E3/52T (Date Code 1038) - 100% failure - high forward voltage, Vf. 
  • Maxim MAX4137EWG (Date Code 0912) - 100% failure - supply line pulling down to the negative rail with no output signal and none of the ground pins are internally connected.
As of March 31, 2011 be lookout for the following high risk electronic components:
  • Xilinx XC4010XL-2PQ100C, 22% failure (Date Code 0525) - programming failure in JTAGtesting and Vcc shorted to GND.
  • Xilinx XC17SO5XLPD8C, 43% failure (Date Codes 0913) - ID error.
  • International Rectifier IRAMX20UP60A-2, 15% failure (no date code marked on parts or labels) - incorrect outputs and missing/broken pins.
As of March 23, 2011 be lookout for the following high risk electronic components:
  • Fuji 2SK902, 12% failure (Date Code not marked or labeled) - high gate-source saturation current, Igss, above +/-1uA with +/-20V gate-source voltage .
  • Ramtron FM24C16A-G, 8% failure (Date Codes 0935 and 0939) - program and verify errors.
  • Linear Technology LT1308BCF, 46% failure (Date Code 0536) - very low reference and output voltage.
  • Vishay SSB43L-E3/52T, 100% failure (Date Codes 0108) - high forward voltage, Vf, above 0.6V with 4A forward current.
  • Integrated Device Technology IDT70V28L20PFI, 6% failure (Date Code 0729) - open pins and bad protection diodes. 
  • Panasonic ECQ-P1H823GZ, 100% failure (Serial Number 10032008) - capacitance outside of specification, high and low, and high dissipation factor.
  • Fuji 2SK902, 12% failure (Date Code not marked or labeled) - gate-source saturation current above +/-100nA with +/-20V gate-source voltage.
  • Pan Jit 1SMB3EZ30, 25% failure (Lot number 110822834) - high leakage current, Ir, and Zener voltage, Bvz.
  • Evox PHE450RF6220JR06L2, 30% failure (Date Code not marked or labeled) - capacitance outside of specification, high and low, and high dissipation factor.
As of March 9, 2011 be lookout for the following high risk electronic components:
  • Globespan GS2237-208-001PC1, 30% failure (Date Code 0049) - open/short pins and bad protection diodes.
  • Infineon TLE5206-2G, 100% failure (Date Code 0829) - 28% flagged EF pin, 30% with one channel having no output, and 42% with pulled down output.
  • Panasonic ECJ1VB1A105K, 15% failure (Date Code 1035) - low capacitance.
  • Altera EPM7064LC84-15, 100% failure (Date Code 0607) - ID error.
  • Bourns TISP4070M3BJR-S, 100% failure (Date Code 038) - high, breakover voltage, Vbo, above 88V.
  • Vishay SFH6943-3, 43% failure (Date Code 0541) - high LED and collector to emitter leakage current, high forward voltage, Vf, and low CTR. 
  • AVX TPSD477M006R0045, 100% failure (Date Code 1041) - high equivalent series resistance, ESR.
  • Infineon BSP372L6327, 100 failure (Date Code 1037) - high on-state drain-source resistance, Rds(on).
As of February 8, 2011 be lookout for the following high risk electronic components:
  • Infineon BTS432E3, 16% failure (Date Code 0821) - no output current and failed switching.
As of February 2, 2011 be lookout for the following high risk electronic components:
  • Xilinx XC5202-6PC84C, 7% failure (Date Code 0927) - 5% have programming error (unit cannot be configured through JTAG port) and communication error, 2% with open/short pins and bad protection diodes.
  • Analog Devices AD96685BH, 5% failure (Date Codes 0311 and 0322) - incorrect output signal.
  • National Semicondutor LM150K/883B, 6% failure (Date Codes 0245) - 5% had low ouput, 1% had high poutput.
  • PMC Sierra HDMP-1022G, 4% failure (Date Code 0826) - bad protection diode.
As of January 26, 2011 be lookout for the following high risk electronic components:
  • Maxim MAX3430ESA, 100% failure (Date Code 0937) - high leakage current.
  • Infineon BAS21UE6327, 2.5% failure (no date code marked on label or devices) - lowbreakdown voltage.
  • Infineon ITS716G, 2% failure (mixed date codes - 1016, 1022, 1024, 1026, 1032, and 1036) - no output in one or more channels.
As of January 10, 2011 be lookout for the following high risk electronic components:
  • AMD AM79C874VC, 45% failure (Date Code 0351) - open and short pins, damaged protection diodes, and heavily contaminated pins.
  • Linear Technology LT1085IM#PBF, 100% failure (Date Code 0951) - low output voltage when the output current increased to full load.
As of December 20, 2010, be lookout for the following high risk electronic components:
  • ON Semiconductor UC2843BD1R2G, 35% failure (date codes 0639, 0640, and 1015) - no gate drive output.
  • ON Semiconductor 1SMA5919BT3G, 100% failure (date code 029) - high zener voltage, Vz.
  • Vicor V48B3V3C150L, 51% failure (no date code on label or marked on the devices) - high output voltage.
  • Infineon BTS133, 100% failure (date code 0936) - high on-state drain-to-source resistance, Rds(on).
  • Murata GRM188R61A475KE15D, 84% failure (date code 1024) - high dissipation factory, DF.
  • AVX CB027D0104JBA, 7% failure (date code printed as 09+) - high dissipation factor.
As of December 7, 2010, be lookout for the following high risk electronic components:
  • Infineon BSP75NL, 50% failure - high threshold and clamped breakdown voltages
  • Infineon TLE5206-G, 82% failure - clamped outputs with the error flag active.
  • Atmel AT29C040A-90TU, 15% failure - program and verify error.
  • Atmel AT91SAM7S256-AU, 100% failure - blank-check error after erasing.
  • International Rectifier HFA16TB120PBF, 6% failure - high reverse current, Ir, and lowbreakdown voltage, Vbr.
  • International Rectifier IRAMS10UP60B, 12% failure - low bootstrap voltage.
  • Toshiba USF8G48, 12% failure - high repetitive peak off-state current, Idrm, and repetitive peak referse current, Irrm.
  • Anachip PEEL18CV82J-25L, 100% failure - program and verify error.
  • Maxim MAX4678EUE+T, 100% failure - high on resistance.
  • Teccor P3300AA61 - 100% failure - high VT (part not switching) and high IS (part not turning on).
As of November 15, 2010, be lookout for the following high risk electronic components:
  • Analog Devices AD652AQ, 15% failure - clamped outputs to 5V.
  • NEC UPD70320L-8, 11% failure - open/short pins and bad protection diodes.
  • Sanrex RFS300CA50, 29% failure - high forward voltages.
  • Infineon BSP752P, 6% failure - no load current.
  • PMC Sierra/Agilent HDMP-1022G, 13% failure - open/short pins and bad protection diodes.
  • PMC Sierra/Agilent HDMP-1024G, 20% failure - open/short pins and bad protection diodes.
  • Atmel AT45DB642D-CNU, 83% failure - blank-check error that cannot erase program.
  • NEC UPD7225GC-AB6, 10% failure - short pins and bad protection diodes.

 

As of November 1, 2010, be lookout for the following high risk electronic components:

  • Infineon BSP75N, 79% failure - high Vin(th), over 2.5V specification limit.
  • Intel P28F001BX-B120, 100% failure - ID error (devices are P28F001BX-T with TOP BOOT).
  • Analog Devices ADM6320CZ29ARJZ, 45% failure - thresholds are for the 5V version and reset pins are high.
  • International Rectifier IRFR3710ZPBF, 100% failure - Vgs(th) measures lower than the 2V specification limit.
  • Texas Instruments NE5532ADR, 36% failure - no output at one channel or both of two two channels.
  • Motorola MC68705U3CS, 10% failure - blank-check error and broken pins.
  • STMicroelectronics X0205NA1BA2, 88% failure - Idrm, Irrm, IL, IH, and Vtm failures.
  • Texas Instruments TPS3808G33DBVR, 73% failure - threshold levels are for the 5V and 3V versions.
  • Kemet T495X476K010AT, 4% failure - high ESR.
  • Texas Instruments TLE2062ACD, 98.5% failure - low outputs, low output swing, and distorted ouputs.
  • Analog Devices AD9844AJSTZ, 35% failure - shorts.

 

As of September 20, 2010, be lookout for the following high risk electronic components:

  • AVX TPME477K006R0018, 100% failure - high dissipation factor and equivalent series resistance (ESR).
  • Texas Instruments TPS3808G30DBVR, 80% failure - reset voltages mixed, some high, some low, and one-third consistent with a 5V device (requested device is 3V). See below photo.
  • Agilent/PMC Sierra HDMP-1022G, 52% failure - open and shorted pins with bad protection diodes.
  • Agilent/PMC Sierra HDMP-1024G, 56% failure - open and shorted pins with bad protection diodes.
  • Kemet T510X157K016ATE040, 100% failure - 100% failure on high ESR, mixed failures on low capacitance and high dissipation factor (DF).
  • PMC Sierra PM4354-NGI, 23% failure - open pins and bad protection diodes.

As of September 9, 2010, be lookout for the following high risk electronic components:

  • Infineon BTS113A, 100% failure - high gate threshold voltage, Vgs(th).
  • Atmel AT49BV322D-70TU, 43% failure - program ID and program read/verify failures.
  • International Rectifier IRFB4610PBF, 5% failure - low gate threshold voltage, Vgs(th), and high drain-to-source leakeage, Idss.
  • AVS TPSE336K035R0100, 90% failure - high ESR (see photo below). 
  • Texas Instruments TLV5625CDG4, 14% failure - no change in output voltage at changes in digital data input.

As of September 1, 2010, be lookout for the following high risk electronic components:

  • Vishay Si3865BDV-T1-E3, 100% failure - high on-state drain-source resistance, Rds(on), and shorts.
  • Texas Instruments TPS72501DCQR, 56% failure - low output voltage.
  • Texas Instruments TPS79501DCQR, 50% failure - fluctuating output voltage.
  • STMicroelectronics STP5NK80Z-10N, 6% failure - Rds(on) within range busmixed gate threshold voltage, Vgs(th), results higher and lower than manufacturer specifications. 
  • Texas Instruments MAX3232IPW, 32% failure - low triangular signals at the driver output.
  • Vishay U440, 9% failure - low breakdown voltage between gate and source, V(br)gss, low gate source voltage in off state, Vgs(off), that the drain current still high when Vgs was above -6V.
  • Fairchild FDD8424H, 6% failure - high drain-to-source leakage, Idss, and high Vgs(th).
  • PMC/Agilient HDMP-1022G, 5% failure - open/short pins and bad protection diodes (overvoltage damage).
  • PMC/Agilent HDMP-1024G, 6% failure - open/short pins and bad protection diodes (overvoltage damage).
  • NXP BCW60D, 44% failure - opens, high base current and high collector to base leakage, Icbo.
  • Toshiba TLP280-4GB, 8% failure, the diode was open resulting in open collector-emitter saturation voltage, Vce(sat).
  • Infineon IPB100N06S3L-04, 100% failure - high gate threshold voltage, Vgs(th).
  • Texas Instruments TL062ACD, 5% failure - low output swing and faulty output waves (see below photo).
  • PMC-Sierra PM4354-NGI, 32% failure - open/short pins and bad protection diodes (overvoltage damage).
  • Infineon ITS4880R, 15% failure - outputs remain low when input is high (failured output switching function).

As of August 23, 2010, be lookout for the following high risk electronic components:

  • Infineon TLE6285G, 34% failure - low receiver outputs.
  • Harris/Intersil CDP1805ACE, 80% failure - bad protection diodes.
  • Harris/Intersil CDP1854ACE, 90% failure - bad protection diodes.
  • Harris/Intersil CDP68HC68PIE, 23.2% failure - shorted pins and bad protection diodes (used). 
  • Murata/C&D NTV0509MC 59.3% failure - high input current, clamped negative output and output voltage above and below the tolderance envelope.
  • Infineon BTS711L1, 7.5% failure - one of the four channels in a unit had no load current. 

As of August 20, 2010, be on the lookout for the following high risk electronic components:

  • Intel TE28F128J3C150, 5% failure - blank check (existing programming).
  • Sony Blueray drive BC-5500S, 5% failure - intermittent SCSI error and stalls during Spin-up/Spin-down.
  • Vishay Si7852DP-T1-GE3, 19.8% failure - open MOSFET, high Idss, low Vgs(th).
  • Spansion S29AL016D90TFI020, 25% failure - write program and verify errors (cannot accept programming). 
  • Atmel AT91SAM7S256-AU, 5.4% failure - blank-check, program, and verify errors (previously programmed, cannot accept new programming).
  • Xilinx XC3020A-7PQG100I, 25% failure - open/short pins and bad protection diodes.

As of August 5, 2010, be on the lookout for the following high risk electronic components:

  
  • ON Semiconductor MC34063ADR2G, 8.5% failure - high output voltage, Vout, and short circuits.
  • Intel N82C540-2, 14.9% failure - bad protection diodes (used).
  • International Rectifier IRF7103QPBF, 9% failure - low gate threshold voltage, Vgs(th), and high drain-to-source leakage current, Idss.
  • NXP PXAG49KBA, 17.5% failure - program ID error, write program failure, and program load error.
  • Vishay 1.5KE20A-E3/54, 35.5% failure - high reverse current leakage, Id, and low breakdown voltages, Vbr.
  • Vishay SI4488DY, 10% failure - high drain-to-source leakage current, Idss.
  • Microchip TC913ACOA, 100% failure - low output voltage, Vout.
  • Maxim MAX1792EUA33+T, 100% failure - low output voltage, Vout.
 

As of July 27th, 2010, be on the lookout for the following high risk electronic components:

  • Xilinx XC3020-70PC84I, 56% failure - bad protection diodes (used/overvoltage damage).

  • Vishay SI6865BDV-TI-E3, 30% failure - high on resistance, Rds(on).

  • International Rectifier IRF7855PBF, 100% failure - low gate threshold voltage, Vgs(th).

 

As of July 12, 2010, be on the lookout for the following high risk devices:

  • TDK ACT45B-510-2P, 100% failure - low inductance.
  • NEC/Tokin TEESVA1A60M8R, 10% failure - low capacitance and high ESR.
  • ON Semiconductor NCV33152DR2G, 12.5% failure - inactive low-side transistor.
  • Texas Instruments 35ZLH220MFZ8X11.5, 100% failure - high inductance.

As of July 6, 2010, be on the lookout for the following high risk devices:

  • Intersil/Elantek EL4093CSZ, 38% failure - distorted outputs.
  • Atmel ATMEGA169PV-8MU, 6.4% failure - program identification error.
  • Analog Devices (PMI) MLT04GS, 8.4% failure - clamped outputs.
  • Texas Instruments UCC2813DTR-0, 12.8% failure - ouput reference voltages for devices with alternate suffixes.
  • Xilinx XC3020-70PC84I, 14% failure - short pins and bad protection diodes.

 

 

As of June 25, 2010, be on the lookout for the following high risk devices:

 

  • Infineon BTS7960B, 51% failure - output not switching.
  • Vishay U1SB-E3, 9.5% failure - hih Ir (reverse current) and Vf (instantaneous voltage).
  • Altera EPM7160SQC160-7, 34.8% failure -cannot access JTAG ID Code.
  • Altera EPM7032SLC44-7N, 100% failure - program ID error. 
 

 

 

 

 

As of June 18, be on the lookout for the following high risk devices:

  • Infineon transistor SPP11N60CFD, 66% failure - low Gate Threshold Voltage, Vgs(th).
  • Analog Devices Supervisory/Sequencing Circuit ADM1060ARUZ, 6% failure - open/short pins and bad protection diodes.
  • STMicroelectronics PowerMOSFET VNS3N04D, 17.5% failure - high drain-to-source leakage current, Idss, and high Static Drain-Source On Resistance, Rds(on).

 

As of June 14, 2010, be on the lookout for the following high risk devices:

  • Texas Instruments TA3004PFBR, 9% failure - short pins and bad protection diodes.
  • Nippon Electric Company (NEC) UPD71055C-10, 8% failure - bad protection diodes.
  • Texas Instruments UC2854DW(G4), 10% failure - low reference voltage.
  • Infineon SPP20N60C3, 5% failure - shorted drain-to-source junction.
  • ST Mictroelectronics VNS3NV04D, 20% failure - high static drain-source On Resistance, Rds(on), and Drain-to-Source Leakage Current, Idss.
  • Altera EPM7160SQC160-7, 34% failure - cannot access JTAG ID Code.

 

As of May 26, 2010, be on the lookout for the following high risk devices:

  • Kemet T520V226M020ATE040, 100% failure - high ESR
  • Texas Instruments OPA2541SM, 16% failure - clipped and clamped output
  • ON Semiconductor NID6002NT4G, 100 failure - high drain-to-source leakage current
  • Fairchild FDB2532, 5% failure - low gate threshhold voltage, Vgs(th), and high drain-to-source leakdage current (Idss)
  • Nichicon PCF0J331MCL1GS, 100% failure - high ESR
  • Analog Devices AD8310ARM, 100% failure - output is clamping to the supply and drawing current at no load to overheat the devices
  • Texas Instruments TPS40009DGQR, 96% failure - unstable output and feedback voltages
  • BS62LV4006-EIP55, 10% failure - bad protective diodes
  • Texas Instruments OPA2343UA, 16% failure - no signal on both channels

 

As of May 19, 2010, be on the lookout for the following high risk devices:

 
  •   ST Microelectronics ST62T28CM6, 100% failure - blank check (parts previously programmed)
  •   Micron MT47H64M16HR-3AT:3, 10.3% failure - open/short pins, bad protection diodes, missing solder balls
  •  Sanyo 6TPF330M9L, 100 failure - high ESR
  • Texas Instruments TPS40054PWPR, 100% failure - low output voltage caused by low reference voltage at the FB pin.